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Nanjing Xince Software Technology Co., Ltd. specializes in creating integrated platforms for semiconductor wafer level testing and chip inspection systems. The company is committed to providing customers with a one-stop platform service for the localization and transformation of semiconductor testing equipment, as well as system integration. The company's goal is to become an advanced supplier of wafer level on chip testing, device measurement system software and hardware in China, to meet the needs of domestic users, and to develop customized services for semiconductor testing equipment and system integration software.

The equipment involved includes: manual probe station, semi-automatic probe station, fully automatic probe station, silicon optical probe station, RF probe station, high and low temperature probe station. In addition, it involves the distribution of chip ESD testing systems, packaging and process testing equipment, etc. Our service areas cover semiconductor wafer level on-chip testing, RF microwave device measurement, high-power device testing, micro assembly packaging process testing, failure analysis, material testing and other application industries